DocumentCode
2733363
Title
Gold-Gold Interconnects to Copper Pillar using fast Thermal Compression Bonding using Non-conductive paste
Author
Frye, D. ; Guino, R. ; Gupta, S. ; Sano, M. ; Sato, K. ; Iida, K.
Author_Institution
Henkel Corp., Irvine, CA, USA
fYear
2010
fDate
1-4 June 2010
Firstpage
427
Lastpage
430
Abstract
Flip chip bonding requires a device to be flipped and attached to the bond pads or traces on the substrate. For lower pitch devices with large bond pads, this was accomplished using gravity reflow followed by capillary underfill (CUF). For fine-pitch devices mounted close to each other on a substrate, CUF has not been as effective as the use of a Non-conductive paste (NCP) during Thermal Compression Bonding (TCB). The NCP provides reliability during post bonding testing and ensures a strong die to substrate bonding. The authors will describe the formulation of a new NCP that provides fast, reliable bonding for Copper Pillar and Gold Gold bonding.
Keywords
Bonding; Copper; Flip chip; Gold; Gravity; Materials testing; Microprocessors; Packaging; Temperature; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
Conference_Location
Las Vegas, NV, USA
ISSN
0569-5503
Print_ISBN
978-1-4244-6410-4
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2010.5490938
Filename
5490938
Link To Document