• DocumentCode
    2733363
  • Title

    Gold-Gold Interconnects to Copper Pillar using fast Thermal Compression Bonding using Non-conductive paste

  • Author

    Frye, D. ; Guino, R. ; Gupta, S. ; Sano, M. ; Sato, K. ; Iida, K.

  • Author_Institution
    Henkel Corp., Irvine, CA, USA
  • fYear
    2010
  • fDate
    1-4 June 2010
  • Firstpage
    427
  • Lastpage
    430
  • Abstract
    Flip chip bonding requires a device to be flipped and attached to the bond pads or traces on the substrate. For lower pitch devices with large bond pads, this was accomplished using gravity reflow followed by capillary underfill (CUF). For fine-pitch devices mounted close to each other on a substrate, CUF has not been as effective as the use of a Non-conductive paste (NCP) during Thermal Compression Bonding (TCB). The NCP provides reliability during post bonding testing and ensures a strong die to substrate bonding. The authors will describe the formulation of a new NCP that provides fast, reliable bonding for Copper Pillar and Gold Gold bonding.
  • Keywords
    Bonding; Copper; Flip chip; Gold; Gravity; Materials testing; Microprocessors; Packaging; Temperature; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-6410-4
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2010.5490938
  • Filename
    5490938