• DocumentCode
    2733378
  • Title

    Pixel-level delta-sigma ADC with optimized area and power for vertically-integrated image sensors

  • Author

    Mahmoodi, Alireza ; Joseph, Dileepan

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, AB
  • fYear
    2008
  • fDate
    10-13 Aug. 2008
  • Firstpage
    41
  • Lastpage
    44
  • Abstract
    Area and power optimization of a first-order delta-sigma analog-to-digital converter (ADC) for pixel-level data conversion is presented. The ADC is designed for use in a vertically-integrated logarithmic CMOS image sensor. A switched-capacitor modulator with minimum area has been employed. Unlike other similar structures, the decimation is performed inside the pixel to decrease its output bit rate. The proposed ADC has an area of 32 times 31 mum2 and consumes 680 nW of power to achieve 80 dB of signal-to-noise ratio with a frame rate of 50 Hz. The circuit was implemented in 0.18 mum CMOS technology with a die area of 2 mm2 and has been sent for fabrication.
  • Keywords
    CMOS image sensors; delta-sigma modulation; switched capacitor networks; CMOS image sensor; area optimization; delta-sigma analog-to-digital converters; pixel-level data conversion; power 680 nW; power optimization; size 0.18 mum; switched-capacitor modulator; Analog-digital conversion; Bit rate; CMOS image sensors; CMOS technology; Circuits; Data conversion; Fabrication; Image sensors; Pixel; Signal to noise ratio;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2008. MWSCAS 2008. 51st Midwest Symposium on
  • Conference_Location
    Knoxville, TN
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-4244-2166-4
  • Electronic_ISBN
    1548-3746
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2008.4616731
  • Filename
    4616731