DocumentCode
2733378
Title
Pixel-level delta-sigma ADC with optimized area and power for vertically-integrated image sensors
Author
Mahmoodi, Alireza ; Joseph, Dileepan
Author_Institution
Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, AB
fYear
2008
fDate
10-13 Aug. 2008
Firstpage
41
Lastpage
44
Abstract
Area and power optimization of a first-order delta-sigma analog-to-digital converter (ADC) for pixel-level data conversion is presented. The ADC is designed for use in a vertically-integrated logarithmic CMOS image sensor. A switched-capacitor modulator with minimum area has been employed. Unlike other similar structures, the decimation is performed inside the pixel to decrease its output bit rate. The proposed ADC has an area of 32 times 31 mum2 and consumes 680 nW of power to achieve 80 dB of signal-to-noise ratio with a frame rate of 50 Hz. The circuit was implemented in 0.18 mum CMOS technology with a die area of 2 mm2 and has been sent for fabrication.
Keywords
CMOS image sensors; delta-sigma modulation; switched capacitor networks; CMOS image sensor; area optimization; delta-sigma analog-to-digital converters; pixel-level data conversion; power 680 nW; power optimization; size 0.18 mum; switched-capacitor modulator; Analog-digital conversion; Bit rate; CMOS image sensors; CMOS technology; Circuits; Data conversion; Fabrication; Image sensors; Pixel; Signal to noise ratio;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2008. MWSCAS 2008. 51st Midwest Symposium on
Conference_Location
Knoxville, TN
ISSN
1548-3746
Print_ISBN
978-1-4244-2166-4
Electronic_ISBN
1548-3746
Type
conf
DOI
10.1109/MWSCAS.2008.4616731
Filename
4616731
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