• DocumentCode
    2733379
  • Title

    Performance and modeling of antimonide-based heterostructure backward diodes for millimeter-wave detection

  • Author

    Fay, P. ; Schulman, J.N. ; Thomas, S., III ; Chow, D.H. ; Boegeman, Y.K. ; Holabird, K.S.

  • Author_Institution
    Dept. of Electr. Eng., Notre Dame Univ., IN, USA
  • fYear
    2002
  • fDate
    6-8 Aug. 2002
  • Firstpage
    334
  • Lastpage
    342
  • Abstract
    Heterostructure backward diodes have been fabricated and characterized for use as zero-bias millimeter-wave detectors. Sensitive detector performance in the W-band was achieved by scaling the active area to 1.5×1.5 μm2 through the use of high-resolution i-line stepper lithography. Responsivities of 2450 V/W and 2341 V/W were measured on-wafer at 95 GHz and 110 GHz, respectively. The detectors exhibit good detection linearity, with 0.8 dB compression, measured at an RF power of 4 μW at 95 GHz. A nonlinear device model, based on bias-dependent millimeter-wave S-parameter measurements, has been developed. The model is consistent with the measured frequency response, responsivity, and detector compression characteristics. Extrapolation using the model to reduced device dimensions suggests that this device technology should provide appreciable responsivities (>1000 V/W) at frequencies through G-band and beyond.
  • Keywords
    III-V semiconductors; S-parameters; antimony compounds; frequency response; lithography; millimetre wave detectors; millimetre wave diodes; millimetre wave measurement; semiconductor device measurement; semiconductor device models; 1.5 micron; 110 GHz; 4 muW; 95 GHz; G-band/W-band detection; InAs-AlSb-GaSb; RF power detection; active area scaling; antimonide-based heterostructure backward diodes; bias-dependent mm-wave S-parameter nonlinear device models; detection linearity; detector compression; detector responsivity; extrapolated device dimension reduction; frequency response; high-resolution i-line stepper lithography; millimeter-wave detection; zero-bias mm-wave detectors; Detectors; Diodes; Frequency measurement; Linearity; Lithography; Millimeter wave measurements; Millimeter wave technology; Power measurement; Radio frequency; Scattering parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Performance Devices, 2002. Proceedings. IEEE Lester Eastman Conference on
  • Print_ISBN
    0-7803-7478-9
  • Type

    conf

  • DOI
    10.1109/LECHPD.2002.1146772
  • Filename
    1146772