Title :
Surface mount solder joint reliability controlling the thermal expansion
Author :
Engelmaier, Werner
Author_Institution :
AT&T Bell Labs., Whippany, NJ, USA
Abstract :
The reliability of the solder joints of surface-mounted assemblies is a continuing concern. This concern stems from the very complex and little understood nature of the interacting mechanisms underlying thermally induced solder joint fatigue combined with the highly varying nature of accelerated reliability testing and the frequently contradictory results. The nature of the problem is discussed. The different types of surface-mount attachments are highlighted in the context of accelerated reliability test results. Accelerated reliability test concerns are discussed and testing options given. Options for increased solder-joint reliability are also suggested
Keywords :
electronic equipment testing; life testing; reliability; soldering; surface mount technology; thermal expansion; accelerated reliability test; solder joints; surface-mounted assemblies; thermal expansion; Acceleration; Capacitive sensors; Fatigue; Lead; Life estimation; Power system reliability; Soldering; Temperature; Testing; Thermal expansion;
Conference_Titel :
Electronic Manufacturing Technology Symposium, 1988, Fourth IEEE/CHMT European International
Conference_Location :
Neuilly sur Seine
DOI :
10.1109/EEMTS.1988.75955