Title :
Signal Integrity Ensured Through Impedance Characterization of Advanced High-Speed Design
Author :
Amedeo, Alexandre ; Gautier, Cyrille ; Costa, Francois ; Bernard, Laurent
Author_Institution :
Thales Commun., Land & Joint Syst., Colombes
Abstract :
It is increasingly important to use Controlled Impedance for manufacturing High-Speed and high density-interconnect (HDI) printed circuit board (PCB). Furthermore, signal integrity (SI) tools are required to prevent and reduce most of impedance mismatch and crosstalk problems. This paper presents the impedance characterization of PCB traces, created in an industrial context. From the first specifications to Time domain Reflectometer (TDR) measurements in PCB, we describe the differences between calculated impedances in layer stack, coupon and micro-section analysis. Besides, the impact of Net geometry on characteristic impedance is evaluated through both 2D and 3D simulations.
Keywords :
integrated circuit interconnections; printed circuit design; printed circuits; advanced high-speed design; controlled impedance; high density-interconnect printed circuit board; high-speed interconnect printed circuit board; impedance characterization; micro-section analysis; time domain reflectometer measurements; Communication system control; Control systems; Degradation; Dielectric losses; Impedance measurement; Manufacturing; Permittivity; Printed circuits; Signal design; Velocity measurement;
Conference_Titel :
Electromagnetic Compatibility, 2009 20th International Zurich Symposium on
Conference_Location :
Zurich
Print_ISBN :
978-3-9523286-4-4
DOI :
10.1109/EMCZUR.2009.4783437
