• DocumentCode
    2733576
  • Title

    Influence of measurement antenna scattering on the radiated electromagnetic field

  • Author

    Öing, Stefan ; John, Hans-Jörg

  • Author_Institution
    R&D EMC, INCASES Eng. GmbH, Paderborn, Germany
  • fYear
    1996
  • fDate
    19-23 Aug 1996
  • Firstpage
    469
  • Lastpage
    473
  • Abstract
    The prediction of the radiated electromagnetic field from printed circuit boards and/or parts of electronic systems is dealt with by more and more publications. Numerical techniques such as the method of moments are used to solve highly complex mathematical expressions. The article shows that for simple structures a good compliance with measurement results can be achieved. However, one has to be aware of mismatches of about 20 dB μV/m in the specific frequency band, which seems to be caused by incorrect models used in the chosen analysis technique. One possible reason for these mismatches is analysed. The theoretical background is described and illustrated by real benchmarks. The first assumption for the reason of these mismatches is often the inaccuracy of modelling the digital and/or analog devices, but only small changes occur after modifying them. Moreover, it can be stated that in the case of fully theoretical examples, which could be solved for analytically, the compliance between the numerical and analytical solution is nearly perfect. Therefore, we conclude that the measurement environment causes the mismatches
  • Keywords
    antennas; electromagnetic compatibility; electromagnetic fields; electromagnetic interference; electromagnetic wave scattering; electronic equipment testing; printed circuit testing; EMC; analog devices; analytical solution; digital devices; electronic systems; frequency bands; measurement antenna scattering; measurement results; method of moments; numerical solution; numerical techniques; printed circuit boards; radiated electromagnetic field; Antenna measurements; Clocks; Costs; Electromagnetic fields; Electromagnetic measurements; Electronic design automation and methodology; Frequency; Large-scale systems; Logic; Scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1996. Symposium Record. IEEE 1996 International Symposium on
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    0-7803-3207-5
  • Type

    conf

  • DOI
    10.1109/ISEMC.1996.561415
  • Filename
    561415