Title :
A performance metric for discrete-time chaos-based truly random number generators
Author :
Beirami, Ahmad ; Nejati, Hamid ; Massoud, Yehia
Author_Institution :
Electr. & Comput. Eng. Dept., Rice Univ., Houston, TX
Abstract :
In this paper, we develop an information entropy-based metric that represents the statistical quality of the generated binary sequence in truly random number generators (TRNG). The metric can be used for the design and optimization of the TRNG circuits as well as the development of efficient post-processing units for recovering the degraded statistical characteristics of the signal due to process variations.
Keywords :
binary sequences; chaos generators; circuit optimisation; cryptography; digital circuits; entropy; random number generation; statistical analysis; TRNG circuit design; binary sequence; cryptography; discrete-time chaos; information entropy-based metrics; post-processing units; statistical quality; truly random number generators; Binary sequences; Chaos; Character generation; Circuit testing; Degradation; Design optimization; Entropy; Measurement; NIST; Random number generation;
Conference_Titel :
Circuits and Systems, 2008. MWSCAS 2008. 51st Midwest Symposium on
Conference_Location :
Knoxville, TN
Print_ISBN :
978-1-4244-2166-4
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2008.4616754
