• DocumentCode
    2734154
  • Title

    Mechanism Analysis of Process Parameters Effects on Bondability in Ultrasonic Ball Bonding

  • Author

    Qi, Jun ; Hung, Ngar Chun ; Li, Ming ; Liu, Deming

  • Author_Institution
    ASM Assembly Automation Ltd. 4/F., Watson Center, Kwai Chung, Hong Kong. email: jqi@asmpt.com
  • fYear
    2005
  • fDate
    38504
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Optimization of ultrasonic bonding process is a time consuming work and still remains a great technological challenge in microelectronic packaging industry due to poor understanding of the mechanism of process parameters effects. In this work, ultrasonic gold ball bonding on aluminum pad was carried out to study the effect of process parameters including bonding power and bonding force on bondability and bond pattern. The evolution of bond pattern and slip area was attributed to the variation of bondability. It is shown that the effects of process parameters on bondability can be explained by the mechanism proposed in this study.
  • Keywords
    Aluminum; Bonding forces; Bonding processes; Force measurement; Gold; Microelectronics; Semiconductor device packaging; Surface contamination; Temperature; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Density Microsystem Design and Packaging and Component Failure Analysis, 2005 Conference on
  • Print_ISBN
    0-7803-9292-2
  • Electronic_ISBN
    0-7803-9293-0
  • Type

    conf

  • DOI
    10.1109/HDP.2005.251374
  • Filename
    4017415