DocumentCode :
2734257
Title :
Magnetic shielding principles of linear cylindrical shield at power-frequency
Author :
Du, Yaping ; Burnett, John
Author_Institution :
Hong Kong Polytech., Kowloon, Hong Kong
fYear :
1996
fDate :
19-23 Aug 1996
Firstpage :
488
Lastpage :
493
Abstract :
Magnetic field shielding of cylindrical shields has been studied for a long time, and analytical solution has been derived at power-frequency. This paper, based on previous work, presents an analysis of the shielding principles of a linear cylindrical shield at power-frequency. The shielding principles are developed from simplified shielding formulas under a single-shell and inside-source configuration. Partition of parameter space is introduced, and four regions (linear induced-current, nonlinear induced-current, flux-shunting and induced-current/flux-shunting shielding) are identified geometrically. It reveals the inherent relationship between the shield parameters and shielding effectiveness. A sensitivity study of the shield parameters is conducted too. It discloses the inherent patterns of the parameter impact on the shielding effectiveness. Convenient design curves are presented in the 2D space. These shielding principles and design curves will alleviate the shielding design burden
Keywords :
electromagnetic induction; magnetic fields; magnetic flux; magnetic shielding; 2D space; design curves; flux-shunting shielding; induced-current/flux-shunting shielding; inside-source configuration; linear cylindrical shield; linear induced-current shielding; magnetic field shielding; nonlinear induced-current shielding; parameter space partition; power frequency; sensitivity study; shield parameters; shielding design; shielding effectiveness; shielding formulas; single-shell configuration; Conductors; Design engineering; Frequency; Guidelines; Job design; Kelvin; Magnetic analysis; Magnetic shielding; Permeability; Power system modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1996. Symposium Record. IEEE 1996 International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-3207-5
Type :
conf
DOI :
10.1109/ISEMC.1996.561419
Filename :
561419
Link To Document :
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