• DocumentCode
    2734314
  • Title

    Development of Thin Electromagnetic Wave Absorption Wall using Patch Elements

  • Author

    Okano, Yoshinobu

  • Author_Institution
    Musashi Inst. of Technol., Tokyo
  • fYear
    2009
  • fDate
    12-16 Jan. 2009
  • Firstpage
    413
  • Lastpage
    416
  • Abstract
    Wireless telecommunication devices such as mobile phones, wireless LANs (2.45 GHz, 5.2 GHz) and UHF radio frequency identification (UHF-RFID) systems have proliferated all over the world. Therefore, electromagnetic interference (EMI) problems have increased. In indoor use, the wireless telecommunications environment can deteriorate due to multiplex reflection interference. This interference must be suppressed to improve wireless communications. Therefore, establishment of a multiplex reflection interference suppression technology is needed. In this study, a convenient, thin EM wave absorption wall was developed. The practicality of this wall was verified through the experimental results of a prototype absorption wall and the calculated results of a finite-difference time-domain (FDTD) numerical analysis. The proposed thin EM absorption wall and the verification results are described in this paper.
  • Keywords
    electromagnetic wave absorption; electromagnetic wave reflection; finite difference time-domain analysis; indoor radio; interference suppression; microstrip antennas; radiofrequency interference; EMI problems; FDTD numerical analysis; electromagnetic interference; electromagnetic wave absorption wall; finite-difference time-domain analysis; frequency 2.45 GHz; frequency 5.2 GHz; indoor radio; multiplex reflection interference suppression; patch elements; wireless telecommunication devices; Electromagnetic interference; Electromagnetic reflection; Electromagnetic wave absorption; Finite difference methods; Interference suppression; Mobile handsets; Radiofrequency identification; Time domain analysis; Wireless LAN; Wireless communication;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2009 20th International Zurich Symposium on
  • Conference_Location
    Zurich
  • Print_ISBN
    978-3-9523286-4-4
  • Type

    conf

  • DOI
    10.1109/EMCZUR.2009.4783478
  • Filename
    4783478