DocumentCode
2734314
Title
Development of Thin Electromagnetic Wave Absorption Wall using Patch Elements
Author
Okano, Yoshinobu
Author_Institution
Musashi Inst. of Technol., Tokyo
fYear
2009
fDate
12-16 Jan. 2009
Firstpage
413
Lastpage
416
Abstract
Wireless telecommunication devices such as mobile phones, wireless LANs (2.45 GHz, 5.2 GHz) and UHF radio frequency identification (UHF-RFID) systems have proliferated all over the world. Therefore, electromagnetic interference (EMI) problems have increased. In indoor use, the wireless telecommunications environment can deteriorate due to multiplex reflection interference. This interference must be suppressed to improve wireless communications. Therefore, establishment of a multiplex reflection interference suppression technology is needed. In this study, a convenient, thin EM wave absorption wall was developed. The practicality of this wall was verified through the experimental results of a prototype absorption wall and the calculated results of a finite-difference time-domain (FDTD) numerical analysis. The proposed thin EM absorption wall and the verification results are described in this paper.
Keywords
electromagnetic wave absorption; electromagnetic wave reflection; finite difference time-domain analysis; indoor radio; interference suppression; microstrip antennas; radiofrequency interference; EMI problems; FDTD numerical analysis; electromagnetic interference; electromagnetic wave absorption wall; finite-difference time-domain analysis; frequency 2.45 GHz; frequency 5.2 GHz; indoor radio; multiplex reflection interference suppression; patch elements; wireless telecommunication devices; Electromagnetic interference; Electromagnetic reflection; Electromagnetic wave absorption; Finite difference methods; Interference suppression; Mobile handsets; Radiofrequency identification; Time domain analysis; Wireless LAN; Wireless communication;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2009 20th International Zurich Symposium on
Conference_Location
Zurich
Print_ISBN
978-3-9523286-4-4
Type
conf
DOI
10.1109/EMCZUR.2009.4783478
Filename
4783478
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