Title :
Quality Technology and Quantitative Management Reliability Monitoring and Performance Measuring for the Exponential Failure Process
Author :
Wu, Chien-Wei ; Yang, Chian-Shang ; Shu, Ming-Hung
Author_Institution :
Feng Chia Univ., Taichung
Abstract :
Reliability monitoring and performance measuring of a failure process are important issues for complex products or repairable systems. Xie et al. proposed a new type of control chart called the t-chart for monitoring processes reliability with low nonconforming rates. In this paper, the t -chart is used as a first controlling stage to monitor an exponential failure process. But, being in control of a process by statistical process control is not enough since an in- control process can produce bad or out of specification products. To measure the performance of the exponential failure process, a lifetime capability index denoted as Ltp is proposed. By taking past in- control sample data of t -chart from the first controlling stage without additional sampling efforts, we develop the second controlling stage that the sampling error is considered to obtain the lower confidence bound of Ltp and to make a decision on how well the process reliability meets specifications.
Keywords :
control charts; maintenance engineering; quality control; sampling methods; statistical process control; complex product; control chart; exponential failure process; lifetime capability index; performance measurement; reliability monitoring; repairable system; sampling error; statistical process control; t-chart; Condition monitoring; Control charts; Engineering management; Industrial engineering; Integrated circuit reliability; Manufacturing processes; Process control; Quality management; Sampling methods; Technology management;
Conference_Titel :
Innovative Computing, Information and Control, 2007. ICICIC '07. Second International Conference on
Conference_Location :
Kumamoto
Print_ISBN :
0-7695-2882-1
DOI :
10.1109/ICICIC.2007.469