• DocumentCode
    2734384
  • Title

    Development of no-rinse screen printable etch paste for contact via in dielectric films

  • Author

    Mishra, R. ; Zhao, L. ; Zhang, Z. ; Guo, H.-W. ; Kumar, P. ; Mungekar, H. ; Stewart, M. ; Weidman, T. ; Parikh, S. ; Paak, S.

  • Author_Institution
    Appl. Mater. Inc., Santa Clara, CA, USA
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    Screen printable etch paste was developed for low cost patterning of dielectric films. This technique offers a simple print and bake approach to pattern without the need for a rinse step. Residue analysis of the etched area showed no sign of any organic residue left behind by the etch process. High carrier lifetime indicates no significant contamination or silicon surface damage. The etched via diameter of 150 μm was demonstrated in thermal oxide while smaller via size of 100 μm was achieved in silicon nitride (SiNx) or a combination of silicon oxide and nitride. Contact resistance measurement through the etched vias using TLM method showed values less than 3mΩ.cm2. The etch paste and process technique can be easily used in PERC cell as well as advanced architecture Interdigitated Back Contact (IBC) cell for low cost patterning.
  • Keywords
    carrier lifetime; contact resistance; elemental semiconductors; nitrogen compounds; silicon; solar cells; thick films; PERC cell; SiNx; contact resistance measurement; dielectric film; high carrier lifetime; interdigitated back contact cell; residue analysis; screen printable etch paste; silicon surface damage; size 100 mum; size 150 mum; Aluminum; Computer architecture; Contact resistance; Dielectrics; Microprocessors; Silicon; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5614195
  • Filename
    5614195