• DocumentCode
    2734460
  • Title

    Characterization of On-chip Interconnections and Capacitive Coupling Effect on CMOS Operational Amplifier

  • Author

    Shim, Yujeong ; Pak, Junso ; Kim, Andrew ; Kim, Joungho

  • Author_Institution
    Terahertz Interconnection & Package Lab., Korea Adv. Inst. of Sci. & Technol., Daejeon
  • fYear
    2009
  • fDate
    12-16 Jan. 2009
  • Firstpage
    449
  • Lastpage
    452
  • Abstract
    The operational amplifier is one of the most important circuits to compose ADCs, DACs and active filters. Now, there are many papers which deal with noise characters of op amps. Most of them are focused on the input signal noises which flow into circuits without account about noise source. Capacitive coupling is one of the most frequent sources of signal noise. The capacitive coupling is inevitable because of high integration. This paper investigates mechanism of input noises flowing into the op amp and effects of capacitive coupling on the op amp as on-chip interconnection modeling and analytical model of the DC output offset voltage of the OPamp are proposed. Furthermore, the models are verified by experimental measurement.
  • Keywords
    integrated circuit noise; interconnections; operational amplifiers; CMOS operational amplifier; capacitive coupling effect; input signal noises; noise characters; on-chip interconnection modeling; on-chip interconnections; Analytical models; CMOS technology; Circuit noise; Coupling circuits; Frequency; Integrated circuit interconnections; Operational amplifiers; Packaging; Semiconductor device modeling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2009 20th International Zurich Symposium on
  • Conference_Location
    Zurich
  • Print_ISBN
    978-3-9523286-4-4
  • Type

    conf

  • DOI
    10.1109/EMCZUR.2009.4783487
  • Filename
    4783487