DocumentCode
2734481
Title
300 GHz fmax self-aligned SiGeC HBT optimized towards CMOS compatiblity
Author
Chevalier, P. ; Barbalat, B. ; Rubaldo, L. ; Vandelle, B. ; Dutartre, D. ; Bouillon, P. ; Jagueneau, T. ; Richard, C. ; Saguin, F. ; Margain, A. ; Chantre, A.
Author_Institution
STMicroelectronics, Crolles, France
fYear
2005
fDate
9-11 Oct. 2005
Firstpage
120
Lastpage
123
Abstract
This paper summarizes the work carried out to improve performances of a SiGeC HBT featuring a selective epitaxial base and an arsenic-doped monocrystalline emitter. A 300 GHz fmax is reported for a transistor sustaining high thermal budget.
Keywords
BiCMOS integrated circuits; Ge-Si alloys; heterojunction bipolar transistors; millimetre wave bipolar transistors; 300 GHz; BiCMOS integrated circuits technology; CMOS compatiblity; SiGeC; arsenic-doped monocrystalline emitter; millimeter wave circuits; optical communication; selective epitaxial base; self-aligned heterojunction bipolar transistor; BiCMOS integrated circuits; Boron; CMOS process; Epitaxial growth; Germanium silicon alloys; Heterojunction bipolar transistors; Millimeter wave communication; Millimeter wave technology; Millimeter wave transistors; Silicon germanium;
fLanguage
English
Publisher
ieee
Conference_Titel
Bipolar/BiCMOS Circuits and Technology Meeting, 2005. Proceedings of the
Print_ISBN
0-7803-9309-0
Type
conf
DOI
10.1109/BIPOL.2005.1555214
Filename
1555214
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