Title :
Proceedings International Test Conference 1997
Abstract :
The following topics are dealt with: dynamic current testing; embedded core testing; ATE hardware for high-speed test; MCM testing; unpowered opens testing; IDDQ testing; standards and benchmarks; memory test; test synthesis; microprocessor test; failure analysis; fault diagnosis; deterministic BIST; mixed signal testing; design for delay test; concurrent checking; DFT; IC testing economics; online testing; VLSI testing; board level tests; test software; sequential ATPG; digital logic analysis; fault modelling; design verification; test language standard; probe technology; and partial scan vs. full scan testing
Keywords :
automatic test equipment; automatic testing; built-in self test; design for testability; economics; electric current measurement; fault diagnosis; integrated circuit testing; integrated memory circuits; logic testing; microprocessor chips; mixed analogue-digital integrated circuits; printed circuit testing; production testing; software standards; ATE hardware; DFT; IC testing economics; IDDQ testing; VLSI testing; benchmarks; board level tests; concurrent checking; design for delay test; design verification; deterministic BIST; digital logic analysis; dynamic current testing; embedded core testing; failure analysis; fault diagnosis; fault modelling; full scan testing; high-speed test; memory test; microprocessor test; mixed signal testing; online testing; partial scan testing; probe technology; sequential ATPG; standards; test language standard; test software; test synthesis; unpowered opens testing;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639589
