DocumentCode :
2734513
Title :
Ultra-low base resistance self-aligned SEG SiGe HBTs for high-sensitivity wide-bandwidth amplifiers
Author :
Tominari, T. ; Shimamoto, Hiromi ; Miura, Makoto ; Yoshida, Yoshinori ; Wada, Shin Ichiro ; Takahashi, Hideyuki ; Arai, Mitsuru ; Hosoe, Hideyuki ; Washio, Katsuyoshi ; Hashimoto, Takashi
Author_Institution :
Micro Device Div., Hitachi, Ltd., Tokyo, Japan
fYear :
2005
fDate :
9-11 Oct. 2005
Firstpage :
124
Lastpage :
127
Abstract :
To fabricate a SiGe HBT with low base resistance, a heavily boron-doped and high-Ge-content base and a high-peripheral-ratio emitter configuration were applied. To retain a high hFE and fT for low intrinsic/extrinsic base resistances, the Ge profile was carefully optimized. The emitter configuration with a high periphery-to-area ratio could be introduced through the advantage of the low parasitic capacitance in the self-aligned structure, and contributed to a further reduction of the base resistance without degradation of fT and fmax. As a result, the base resistance was successfully reduced to about 1/3 of the previous HBT.
Keywords :
Ge-Si alloys; boron; epitaxial growth; heterojunction bipolar transistors; semiconductor doping; wideband amplifiers; Ge profile optimization; SiGe; emitter configuration; heavy base doping; heterojunction bipolar transistor; high-peripheral-ratio emitter layout; parasitic capacitance; selective epitaxial growth; self-aligned SEG HBT; self-aligned structure; ultra-low base resistance HBT; wide-bandwidth amplifiers; Boron; Broadband amplifiers; Degradation; Electrodes; Germanium silicon alloys; Heterojunction bipolar transistors; Low-noise amplifiers; Optical amplifiers; Parasitic capacitance; Silicon germanium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 2005. Proceedings of the
Print_ISBN :
0-7803-9309-0
Type :
conf
DOI :
10.1109/BIPOL.2005.1555215
Filename :
1555215
Link To Document :
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