• DocumentCode
    2734657
  • Title

    Transient power supply voltage (VDDT) analysis for detecting IC defects

  • Author

    Cole, Edward I., Jr. ; Soden, Jerry M. ; Tangyunyong, Paiboon ; Candelaria, Patrick L. ; Beegle, Richard W. ; Barton, Daniel L. ; Henderson, Christopher L. ; Hawkins, Charles F.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    1997
  • fDate
    1-6 Nov 1997
  • Firstpage
    23
  • Lastpage
    31
  • Abstract
    Transient power supply voltage (VDDT) analysis is a new testing technique demonstrated as a powerful alternative and complement to IDDQ testing. VDDT analysis takes advantage of the limited response time of a voltage supply to the changing power demand of an IC during operation. Changes in the VDD response time can be used to detect increases in the power demand of a microcontroller with resolutions of 20 nA at 100 kHz, 1 μA at 1 MHz, and 2.5 μA at 1.5 MHz. These current sensitivities have been shown for ICs with very low IDDQ (<100 nA) and for an IC with an intrinsic IDDQ>300 μA. The present system uses 100 cycle averaging to compensate for low frequency “jitter”. The VDDT signal acquisition protocols, frequency versus sensitivity tradeoffs, hardware considerations, noise limitations, data examples, and areas for future research are described
  • Keywords
    automatic testing; delays; fault diagnosis; integrated circuit noise; integrated circuit testing; microcontrollers; power supplies to apparatus; transients; voltage measurement; waveform analysis; 1 MHz; 1.5 MHz; 100 kHz; 100 nA; 300 muA; CMOS IC; IDDQ testing; IC defects; VDDT analysis; current sensitivities; hardware; microcontroller; noise; sensitivity tradeoffs; signal acquisition protocols; transient power supply voltage; voltage supply; Delay; Frequency; Hardware; Microcontrollers; Power demand; Power supplies; Protocols; Testing; Transient analysis; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1997. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-4209-7
  • Type

    conf

  • DOI
    10.1109/TEST.1997.639590
  • Filename
    639590