Title :
Transient power supply voltage (VDDT) analysis for detecting IC defects
Author :
Cole, Edward I., Jr. ; Soden, Jerry M. ; Tangyunyong, Paiboon ; Candelaria, Patrick L. ; Beegle, Richard W. ; Barton, Daniel L. ; Henderson, Christopher L. ; Hawkins, Charles F.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Abstract :
Transient power supply voltage (VDDT) analysis is a new testing technique demonstrated as a powerful alternative and complement to IDDQ testing. VDDT analysis takes advantage of the limited response time of a voltage supply to the changing power demand of an IC during operation. Changes in the VDD response time can be used to detect increases in the power demand of a microcontroller with resolutions of 20 nA at 100 kHz, 1 μA at 1 MHz, and 2.5 μA at 1.5 MHz. These current sensitivities have been shown for ICs with very low IDDQ (<100 nA) and for an IC with an intrinsic IDDQ>300 μA. The present system uses 100 cycle averaging to compensate for low frequency “jitter”. The VDDT signal acquisition protocols, frequency versus sensitivity tradeoffs, hardware considerations, noise limitations, data examples, and areas for future research are described
Keywords :
automatic testing; delays; fault diagnosis; integrated circuit noise; integrated circuit testing; microcontrollers; power supplies to apparatus; transients; voltage measurement; waveform analysis; 1 MHz; 1.5 MHz; 100 kHz; 100 nA; 300 muA; CMOS IC; IDDQ testing; IC defects; VDDT analysis; current sensitivities; hardware; microcontroller; noise; sensitivity tradeoffs; signal acquisition protocols; transient power supply voltage; voltage supply; Delay; Frequency; Hardware; Microcontrollers; Power demand; Power supplies; Protocols; Testing; Transient analysis; Voltage;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639590
