• DocumentCode
    2734670
  • Title

    Terahertz Near-Field Microscope

  • Author

    Park, H. ; Kim, J. ; Kim, M. ; Han, H. ; Park, I.

  • Author_Institution
    Pohang Univ. of Sci. & Technol., Pohang
  • fYear
    2006
  • fDate
    18-22 Sept. 2006
  • Firstpage
    13
  • Lastpage
    13
  • Abstract
    We report a terahertz pulse apertureless near-field microscope (THz NFM) which combines THz time domain spectroscopy (THz-TDS) and atomic force microscopy (AFM) techniques. By scanning the probe over a GaAs/Au edge, it is found that the THz NFM has a lateral resolution of ~ 80 nm.
  • Keywords
    atomic force microscopy; submillimetre wave spectroscopy; AFM; THz time domain spectroscopy; atomic force microscopy; terahertz near-field microscope; Atomic force microscopy; Gallium arsenide; Gold; Optical imaging; Optical scattering; Optical surface waves; Particle scattering; Probes; Submillimeter wave technology; Ultrafast optics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0400-2
  • Electronic_ISBN
    1-4244-0400-2
  • Type

    conf

  • DOI
    10.1109/ICIMW.2006.368222
  • Filename
    4221956
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2734670