Title :
Terahertz Near-Field Microscope
Author :
Park, H. ; Kim, J. ; Kim, M. ; Han, H. ; Park, I.
Author_Institution :
Pohang Univ. of Sci. & Technol., Pohang
Abstract :
We report a terahertz pulse apertureless near-field microscope (THz NFM) which combines THz time domain spectroscopy (THz-TDS) and atomic force microscopy (AFM) techniques. By scanning the probe over a GaAs/Au edge, it is found that the THz NFM has a lateral resolution of ~ 80 nm.
Keywords :
atomic force microscopy; submillimetre wave spectroscopy; AFM; THz time domain spectroscopy; atomic force microscopy; terahertz near-field microscope; Atomic force microscopy; Gallium arsenide; Gold; Optical imaging; Optical scattering; Optical surface waves; Particle scattering; Probes; Submillimeter wave technology; Ultrafast optics;
Conference_Titel :
Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0400-2
Electronic_ISBN :
1-4244-0400-2
DOI :
10.1109/ICIMW.2006.368222
