Title :
Silicon based system-in-package: a passive integration technology combined with advanced packaging and system based design tools to allow a breakthrough in miniaturization
Author_Institution :
Philips Semicond., Caen, France
Abstract :
The very large development of home and domestic electronic appliances as well as portable device has led the microelectronics industry to evolve in two complimentary directions: "More Moore" with the continuous race towards extremely small dimensions hence the development of SoCs (system on chip) and more recently a new direction that we could name "More than Moore" with the integration of devices that were laying outside the chips and thus the creation of SiPs (system in package). Even though one can oppose SoCs to SiPs, one of the intentions of this paper is to demonstrate that these two approaches are not in competition one with the other. We show some examples of systems that integrate several SoCs. The technology presented is called silicon based system in package. This new technology is based upon the integration of passive devices into silicon. The four critical elements of this technology will be discussed in detail: passive integration, advanced packaging, new IC design development tools, and innovative testing.
Keywords :
elemental semiconductors; integrated circuit design; integrated circuit interconnections; integrated circuit testing; silicon; system-in-package; system-on-chip; IC design development tools; Si; advanced packaging; energy management; integrated circuit design; integrated circuit interconnections; integrated circuit testing; microelectronics industry; passive circuits; passive devices; passive integration technology; silicon based system-in-package; system based design tools; system on chip; CMOS technology; Cost function; Electronics industry; Embedded software; Integrated circuit interconnections; Integrated circuit packaging; Integrated circuit technology; Semiconductor device packaging; Silicon; System-on-a-chip;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 2005. Proceedings of the
Print_ISBN :
0-7803-9309-0
DOI :
10.1109/BIPOL.2005.1555225