Title :
Terahertz near-field measurements of field enhancement near metal objects
Author :
Adam, A.J.L. ; Brok, J. ; van de Nes, A.S. ; Planken, P. C M
Author_Institution :
Delft Univ. of Technol., Delft
Abstract :
We present THz near-field measurements and calculations of the electric field around metal objects with sizes comparable to the wavelength. Several examples are presented, such as the fields of one metal sphere, and of several spheres. We show how the near-field depends on the THz polarization and frequency and on the distance between the spheres. Our results are compared with Mie theory describing the scattering of light by particles. The enhancements of the field due to a sphere are compared with those generated by a metal tip used for near-field imaging.
Keywords :
electric fields; electromagnetic wave scattering; metals; submillimetre wave measurement; Mie theory; electric field calculations; metal objects; metal sphere; metal tip; near-field imaging; submillimetre measurements; terahertz near-field measurements; terahertz polarization-frequency; Electric variables measurement; Frequency; Optical imaging; Optical polarization; Optical pulses; Optical scattering; Optical surface waves; Submillimeter wave measurements; Submillimeter wave technology; Ultrafast optics;
Conference_Titel :
Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0400-2
Electronic_ISBN :
1-4244-0400-2
DOI :
10.1109/ICIMW.2006.368224
