Terahertz near-field measurements of field enhancement near metal objects

Author

Adam, A.J.L. ; Brok, J. ; van de Nes, A.S. ; Planken, P. C M

Author_Institution

Delft Univ. of Technol., Delft

fYear

2006

fDate

18-22 Sept. 2006

Firstpage

15

Lastpage

15

Abstract

We present THz near-field measurements and calculations of the electric field around metal objects with sizes comparable to the wavelength. Several examples are presented, such as the fields of one metal sphere, and of several spheres. We show how the near-field depends on the THz polarization and frequency and on the distance between the spheres. Our results are compared with Mie theory describing the scattering of light by particles. The enhancements of the field due to a sphere are compared with those generated by a metal tip used for near-field imaging.

Keywords

electric fields; electromagnetic wave scattering; metals; submillimetre wave measurement; Mie theory; electric field calculations; metal objects; metal sphere; metal tip; near-field imaging; submillimetre measurements; terahertz near-field measurements; terahertz polarization-frequency; Electric variables measurement; Frequency; Optical imaging; Optical polarization; Optical pulses; Optical scattering; Optical surface waves; Submillimeter wave measurements; Submillimeter wave technology; Ultrafast optics;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on

Conference_Location

Shanghai

Print_ISBN

1-4244-0400-2

Electronic_ISBN

1-4244-0400-2

Type

conf

DOI

10.1109/ICIMW.2006.368224

Filename

4221958