Analisis of internal reflectivity of silicon ELO PV cells obtained by LPE

This work contains analysis of a SiO<;sub>2<;/sub> dielectric geometry influence on a epitaxial lateral overgrowth (ELO) thin films and solar photo-conversion efficiency. Layers used in the experiment were obtained in LPE (Liquid Phase Epitaxy) process in the same thermodynamical conditions: starting temperature of growth: 1193K, temperature difference &#x0394;T=60K, ambient gas: Ar, metallic solvent: Sn+Al and in a different cooling rates: 0,25K/min and 0,75K/min. Also we used various dielectric masks with a different geometry: grid opened in SiO<;sub>2<;/sub> layer along <;110&#x003E; and <;112&#x003E; directions on a p+ boron doped (111) silicon substrate, where silicon dioxide covers from 70% up to 90% of the silicon surface. Results of the analyzes show correlation between efficiency and percentage of SiO<;sub>2<;/sub> coverage and velocity of crystallization on obtained solar cells.