• DocumentCode
    2734928
  • Title

    Testing and optimizing a scale reduction algorithm for a multi-screen video wall application on the META-100 ASIC emulator

  • Author

    Rasmont, O. ; Koulischer, J. ; Schaumont, J. ; Crappe, R.

  • Author_Institution
    Fac. des Polytech., Mons Univ., Belgium
  • fYear
    1995
  • fDate
    7-9 Jun 1995
  • Firstpage
    104
  • Lastpage
    109
  • Abstract
    BARCO is one of the world lending companies in video projection systems. With the introduction of its Graph-X Wall product and the aim to resort to numerical solutions in order to improve picture quality as well as product reliability, sophisticated algorithms are required to provide the user with a flexible multi-screen windowing system. This paper introduces a complex algorithm for a real time scale reduction application. Due to the side effects of numerical computation, to the great amount of computations to be made and to the very wide dispersion of video pictures and scale reduction parameters the only efficient way to validate this algorithm is to display a picture that has been reduced by the algorithm embedded in the ASIC. So it turned out that the best way to achieve such a picture is ASIC emulation. This paper explains the design methodology and the hardware used for this emulation application, developed from a totally new concept in ASIC emulation introduced by the company META-Systems
  • Keywords
    application specific integrated circuits; circuit CAD; circuit analysis computing; field programmable gate arrays; image processing; image processing equipment; logic CAD; real-time systems; Graph-X Wall product; META-100 ASIC emulator; design methodology; flexible multi-screen windowing system; multi-screen video wall application; picture quality; product reliability; scale reduction algorithm; scale reduction parameters; video projection systems; Application specific integrated circuits; Code standards; Computer displays; Design methodology; Embedded computing; Emulation; Filters; Hardware; Silicon; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Rapid System Prototyping, 1995. Proceedings., Sixth IEEE International Workshop on
  • Conference_Location
    Chapel Hill, NC
  • ISSN
    1074-6005
  • Print_ISBN
    0-8186-7100-9
  • Type

    conf

  • DOI
    10.1109/IWRSP.1995.518578
  • Filename
    518578