• DocumentCode
    2735025
  • Title

    Recent Advances on Polymers and Polymer Nanocomposites for Advanced Electronic Packaging Applications

  • Author

    Wong, C.P. ; Xu, J. ; Zhu, L. ; Li, Y. ; Jiang, H. ; Sun, Y. ; Lu, J. ; Dong, H.

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA
  • fYear
    2005
  • fDate
    27-29 June 2005
  • Firstpage
    1
  • Lastpage
    16
  • Abstract
    The advances of semiconductor technology are mainly due to the advances of polymeric materials. These include the use of polymers as adhesives (both conductive and non-conductive), interlayer dielectrics (low-k, low loss dielectrics), encapsulants (discrete and wafer level packaging), embedded passives (high-k and high-Q materials), superhydrophobic self-cleaning lotus effect surfaces, and etc. In this presentation, we review some of the recent advances of polymeric materials and polymer nanocomposites currently being investigated for these types of applications, such as lead-free electrically conductive adhesives (ECAs) for fine pitch and high current density interconnects, flip chip and wafer level underfills, superhydrophobic self-cleaning lotus effect surfaces, as well as high-k and high-Q nanocomposites for embedded capacitors and inductors
  • Keywords
    capacitors; conductive adhesives; electronics packaging; flip-chip devices; high-k dielectric thin films; inductors; nanocomposites; polymers; wafer level packaging; electronic packaging; fine pitch interconnect; flip chip underfills; high current density interconnect; high-Q nanocomposites; high-k nanocomposites; lead-free electrically conductive adhesives; polymer nanocomposites advances; polymeric material advances; self-cleaning lotus effect surfaces; superhydrophobic surfaces; wafer level underfills; Conducting materials; Dielectric losses; Dielectric materials; Electronics packaging; High K dielectric materials; High-K gate dielectrics; Nanocomposites; Polymers; Semiconductor materials; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Density Microsystem Design and Packaging and Component Failure Analysis, 2005 Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7803-9292-2
  • Electronic_ISBN
    0-7803-9293-0
  • Type

    conf

  • DOI
    10.1109/HDP.2005.251427
  • Filename
    4017468