DocumentCode :
2735314
Title :
The ITE safety standard for North America, a development and maintenance process
Author :
Ravo, Kevin L.
Author_Institution :
Underwriters Labs. Inc., Santa Clara, CA, USA
fYear :
1996
fDate :
19-23 Aug 1996
Firstpage :
518
Lastpage :
523
Abstract :
This paper is intended to provide a historical perspective of the current bi-national (USA/Canada) standard for information technology equipment (ITE)-UL 1950/CSA 950 third edition (BINAT). Discussed is the development process of the BINAT, leading ultimately to a tri-national standard (USA/Canada/Mexico) or a truly North American standard. Additionally, the maintenance process for the standard is explained, including information regarding how individuals or organizations may influence the content of the standard, (the BINAT or IEC 950). Specifically covered in the paper are: a discussion of the nature of ITE industry including identification of two differing industry perspectives with respect to safety; a brief history of the safety requirements for the ITE industry; a brief overview of the current safety requirements; a discussion of the ongoing maintenance process for the standard; future activities intended to keep the safety requirements relevant and current; and finally, a call to action to continue the development process of safety requirements to keep pace with the evolving industries
Keywords :
electromagnetic compatibility; information technology; safety; standards; BINAT; Canada; EMC; IEC 950; ITE industry; ITE safety standard; Mexico; North American standard; UL 1950/CSA 950; USA; binational standard; development process; information technology equipment; maintenance process; organizations; overvoltage testing; safety requirements; trinational standard; Certification; Communication industry; Computer industry; History; IEC standards; Information technology; North America; Product safety; Standards development; Standards organizations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1996. Symposium Record. IEEE 1996 International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-3207-5
Type :
conf
DOI :
10.1109/ISEMC.1996.561426
Filename :
561426
Link To Document :
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