DocumentCode
2735323
Title
Development and characterization of advanced process technologies for the fabrication of crystalline-Si solar cells
Author
Rao, Satyavolu S Papa ; Fisher, Kate ; Neumayer, Deborah ; Huang, Qiang ; Kwietniak, Keith ; Liu, Jun ; Vichiconti, James ; Nalaskowski, Jakub ; Newbury, Joseph ; Pyzyna, Adam ; Rossnagel, Stephen ; Totir, George ; Fuller, Nicholas
Author_Institution
IBM T.J Watson Res. Center, Yorktown Heights, NY, USA
fYear
2010
fDate
20-25 June 2010
Abstract
Photovoltaic devices were fabricated at IBM TJ Watson Research Center using a research line designed to run different substrate types concurrently. The process knowledge gained from CMOS IC fabrication is applied to solar cell fabrication to create cells with plated Cu front metallization, Al back contacts, and PECVD SiN ARC. The interaction between substrate type and process conditions for saw damage etch, PECVD SiN deposition and emitter formation (thermal budget exposure) is presented in this paper. Electroplating process characterization results are discussed. The effects on the electrical characteristics of the photovoltaic device due to the process parameters chosen, and due to extrinsic defects, are discussed.
Keywords
electroplating; elemental semiconductors; photovoltaic power systems; plasma CVD; silicon; solar cells; PECVD; Si; advanced process technologies; crystalline-Si solar cells; electroplating process; emitter formation; photovoltaic devices; saw damage etch; solar cell fabrication; thermal budget exposure; Annealing; Copper; Lead; MONOS devices; Substrates; Thickness measurement; Variable speed drives;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location
Honolulu, HI
ISSN
0160-8371
Print_ISBN
978-1-4244-5890-5
Type
conf
DOI
10.1109/PVSC.2010.5614266
Filename
5614266
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