Title :
Computer-aided system for defect inspection in the PCB manufacturing process
Author :
Sanguino, T. J. Mateo ; Smolcic-Rodriguez, M.
Author_Institution :
Dept. of Electron. Eng., Comput. Syst. & Automatics, Univ. of Huelva, Huelva, Spain
Abstract :
This paper presents a visual inspection system aimed at the automatic detection and classification of bare-PCB manufacturing errors. The interest of this CAE system lies in a twofold approach. On the one hand, we propose a modification of the subtraction method based on reference images that allows higher performance in the process of defect detection. On the other hand, this method is combined with a particle classification algorithm based on two measures of light intensity. As a result of this strategy, a machine vision application has been implemented to assist people in etching, inspection and verification tasks of PCBs.
Keywords :
automatic optical inspection; computer aided engineering; computer vision; etching; image classification; object detection; printed circuit manufacture; production engineering computing; CAE system; PCB manufacturing process; bare-PCB manufacturing error; computer aided engineering; computer-aided system; defect detection; defect inspection; error classification; error detection; etching task; inspection task; light intensity measure; machine vision application; particle classification algorithm; printed circuit board; reference image; subtraction method; verification task; visual inspection system; Artificial intelligence; Classification algorithms; Computer aided engineering; Conferences; Etching; Inspection; Machine vision;
Conference_Titel :
Intelligent Engineering Systems (INES), 2012 IEEE 16th International Conference on
Conference_Location :
Lisbon
Print_ISBN :
978-1-4673-2694-0
Electronic_ISBN :
978-1-4673-2693-3
DOI :
10.1109/INES.2012.6249821
