DocumentCode :
2735542
Title :
Towards fully integrated high temperature wireless sensors using GaN-based HEMT devices
Author :
Huque, Mohammed Aminul ; Islam, Syed Kamrul ; Kuruganti, Phani Teja
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN
fYear :
2008
fDate :
10-13 Aug. 2008
Firstpage :
582
Lastpage :
585
Abstract :
Wireless sensors that are capable of working in extreme environments can significantly improve the efficiency and performance of industrial processes by facilitating better monitoring and control. Gallium nitride (GaN), a widely researched wide bandgap material, can potentially be used to fabricate components for sensing and actuation for high temperature integrated wireless sensors. In this paper we are presenting an experimental study on the performance of AlGaN/GaN HEMT at high temperatures (up to 300degC). From test results, DC and microwave parameters at different temperatures were extracted.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; semiconductor device testing; sensors; wide band gap semiconductors; AlGaN-GaN; high electron mobility transistors; integrated wireless sensors; semiconductor device testing; Aluminum gallium nitride; Gallium nitride; HEMTs; III-V semiconductor materials; Industrial control; Monitoring; Photonic band gap; Temperature sensors; Testing; Wireless sensor networks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2008. MWSCAS 2008. 51st Midwest Symposium on
Conference_Location :
Knoxville, TN
ISSN :
1548-3746
Print_ISBN :
978-1-4244-2166-4
Electronic_ISBN :
1548-3746
Type :
conf
DOI :
10.1109/MWSCAS.2008.4616866
Filename :
4616866
Link To Document :
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