• DocumentCode
    2735648
  • Title

    An IEEE 1149.1 based test access architecture for ICs with embedded cores

  • Author

    Whetsel, Lee

  • Author_Institution
    Texas Instrum., USA
  • fYear
    1997
  • fDate
    1-6 Nov 1997
  • Firstpage
    69
  • Lastpage
    78
  • Abstract
    This paper describes work at Texas Instruments regarding development of an IC architecture supporting hierarchical test access of embedded cores
  • Keywords
    IEEE standards; automatic test equipment; automatic testing; built-in self test; computer architecture; digital integrated circuits; integrated circuit design; integrated circuit testing; IC testing; IEEE 1149.1; Texas Instruments; embedded cores; hierarchical test access; test access architecture; Built-in self-test; Circuit testing; Clocks; Emulation; Instruments; Integral equations; Integrated circuit testing; Pins; Registers; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1997. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-4209-7
  • Type

    conf

  • DOI
    10.1109/TEST.1997.639596
  • Filename
    639596
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2735648