Title :
Comparison of intrinsic amorphous silicon buffer layers for silicon heterojunction solar cells deposited with different PECVD techniques
Author :
Pysch, D. ; Meinhardt, C. ; Ritzau, K.-U. ; Bivour, M. ; Zimmermann, K. ; Schetter, C. ; Hermle, M. ; Glunz, S.W.
Author_Institution :
Fraunhofer Inst. for Solar Energy Syst., Freiburg, Germany
Abstract :
In this investigation we compare intrinsic hydrogen diluted amorphous a-Si:H(i) layers deposited by inductively coupled plasma (ICP) to the standard parallel plate (PP) plasma, driven by 13.5 MHz power source. We analyze and compare the growth rate, optical energy gap, homogeneity, passivation quality, and most importantly silicon heterojunction solar cell performance. The ICP a-Si:H(i) layer shows superior properties regarding the growth rate, however, we obtain a slightly better passivation quality with the PP a-Si:H(i) layer, with Voc values up to 723 mV. Looking at the overall solar cell performance we were not able to see any difference between ICP and PP silicon heterojunction solar cell. The best solar cell (with an ICP a-Si:H(i) layer) has an efficiency of 18.7%.
Keywords :
amorphous semiconductors; plasma CVD; silicon; solar cells; PECVD; Si; growth rate; homogeneity; hydrogen diluted amorphous layers; inductively coupled plasma; intrinsic amorphous silicon buffer layers; optical energy gap; parallel plate plasma; passivation quality; plasma enhanced chemical vapour deposition; silicon heterojunction solar cells; Iterative closest point algorithm; Passivation; Photovoltaic cells; Plasmas; Surface texture; Thickness measurement;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-5890-5
DOI :
10.1109/PVSC.2010.5614351