DocumentCode :
2735804
Title :
An efficient method for compressing test data
Author :
Yamaguchi, Takahiro ; Tilgner, Marco ; Ishida, Masahiro ; Ha, Dong Sam
Author_Institution :
Advantest Labs. Ltd., Miyagi, Japan
fYear :
1997
fDate :
1-6 Nov 1997
Firstpage :
79
Lastpage :
88
Abstract :
The overall throughput of automatic test equipment (ATE) is sensitive to the download time of test data. An effective approach to the reduction of the download time is to compress test data before the download. A compression algorithm for test data should meet two requirements: lossless and simple decompression. In this paper we propose a new test data compression method that aims to fully utilize the unique characteristics of test data compression. The key idea of the proposed method is to perform the Burrows-Wheeler transformation on the sequence of test patterns, and then to apply run-length coding. The experimental results show that our compression method performs better than six other methods for compressing test data. The average compression ratio of the proposed method performed on five test data sets is 315, while that for the next best one, the LZW method, is 21
Keywords :
application specific integrated circuits; automatic test equipment; automatic testing; data compression; integrated circuit testing; transforms; ATE; Burrows-Wheeler transformation; automatic test equipment; average compression ratio; compression algorithm; run-length coding; sequence of test patterns; test data; Arithmetic; Automatic test equipment; Automatic testing; Binary trees; Huffman coding; Performance evaluation; Test data compression; Throughput; User interfaces; Workstations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-4209-7
Type :
conf
DOI :
10.1109/TEST.1997.639597
Filename :
639597
Link To Document :
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