DocumentCode :
2736131
Title :
VCO jitter simulation and its comparison with measurement
Author :
Takahashi, Masaharu ; Ogawa, Kimihiro ; Kundert, Kenneth S.
Author_Institution :
Semicond. Co., Sony Corp., Kanagawa, Japan
fYear :
1999
fDate :
18-21 Jan 1999
Firstpage :
85
Abstract :
We have simulated the phase noise of a voltage controlled oscillator (VCO) using an RF circuit simulator, SpectreRFTM. This simulator uses a variation of the periodic noise analysis first proposed by Okumura, et al (1993). It computes the power spectral density of the noise as a function of frequency. By assuming that only white noise sources are present in the oscillator, it is possible to derive a simple relationship between the level of the phase noise and the jitter. This excludes flicker noise from consideration, however, since flicker noise is a low-frequency phenomenon, excluding it only affects the accuracy of the long-term jitter. We compared the jitter with measurement and found the error to be less than 2 dB. An AHDL model for the VCO that efficiently exhibits jitter in the time domain is included. The model was written in Verilog-A. This model can be used to determine the affect of VCO jitter on a larger system, such as a phase-locked loop (PLL)
Keywords :
circuit noise; circuit simulation; jitter; phase noise; voltage-controlled oscillators; white noise; AHDL model; PLL; RF circuit simulator; SpectreRF; VCO jitter simulation; Verilog-A; flicker noise; periodic noise analysis; phase noise; phase-locked loop; power spectral density; voltage controlled oscillator; white noise sources; 1f noise; Analytical models; Circuit noise; Circuit simulation; Computational modeling; Jitter; Phase locked loops; Phase noise; Radio frequency; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1999. Proceedings of the ASP-DAC '99. Asia and South Pacific
Conference_Location :
Wanchai
Print_ISBN :
0-7803-5012-X
Type :
conf
DOI :
10.1109/ASPDAC.1999.759717
Filename :
759717
Link To Document :
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