DocumentCode :
2736264
Title :
The compensation capacitors fault detection method of jointless track circuit based on DBWT and WR
Author :
Zhao Linhai ; Zhankui, Li ; Weining, Liu
Author_Institution :
State Key Lab. of Rail Traffic Control & Safety, Beijing Jiaotong Univ., Beijing, China
Volume :
2
fYear :
2009
fDate :
20-22 Nov. 2009
Firstpage :
875
Lastpage :
879
Abstract :
This paper uses transport-line theory to construct equivalent model of jointless track circuit under shunted state and analyses the principle of track induced circuit in the disconnection fault of compensation capacitor based on the model. At the same time, according to the work principle of cab signal and the consistent changes relationship between cab signal induced voltage and short-circuit current of the track circuit, the induced voltage recorded by cab signal is denoised by DBWT (discrete binary wavelet transform), and then the instantaneous frequency of the signal is extracted by WR (wavelet ridge), finally by detecting the changes of instantaneous frequency to diagnose the disconnection fault of compensation capacitor. This method is verified that it can detect the location of fault capacitor when there is only one capacitor is fault, in addition, it largely overcomes the disadvantages existed in recent detection methods: high cost, bad detection timeliness and influence on railway transportation.
Keywords :
capacitors; compensation; discrete wavelet transforms; fault location; railway industry; transportation; DBWT; WR; compensation capacitors; discrete binary wavelet transform; fault detection; jointless track circuit; railway transportation; track induced circuit; transport-line theory; wavelet ridge; Capacitors; Circuit faults; Discrete wavelet transforms; Electrical fault detection; Electronic mail; Fault detection; Frequency; Rail transportation; Railway engineering; Voltage; fault detection; jointless track circuit; wavelet ridge;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Computing and Intelligent Systems, 2009. ICIS 2009. IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-4754-1
Electronic_ISBN :
978-1-4244-4738-1
Type :
conf
DOI :
10.1109/ICICISYS.2009.5358243
Filename :
5358243
Link To Document :
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