DocumentCode
2736292
Title
Explanation of the device operation principle of amorphous silicon/ crystalline silicon heterojunction solar cell and role of the inversion of crystalline silicon surface
Author
Ghosh, Kunal ; Tracy, Clarence J. ; Herasimenka, Stanislau ; Honsberg, Christiana ; Bowden, Stuart
Author_Institution
Arizona State Univ., Tempe, AZ, USA
fYear
2010
fDate
20-25 June 2010
Abstract
The device operation principle of amorphous silicon/crystalline silicon heterojunction solar cell is discussed. The band diagram obtained by the computer model developed in the commercial simulator Sentaurus shows that the c-Si surface is inverted at the interface between a-Si and c-Si (heterointerface). A strong inversion gives a strong electric field at the c-Si surface, which in turn facilitates the transport of minority carriers across the heterointerface. A high performance device requires a strongly inverted c-Si surface. Calculations are performed to show that the doping of the doped a-Si layer, the thickness of the intrinsic layer, and the defect state density at the heterointerface all affect the inversion of the crystalline silicon surface. Unlike homojunction devices, the defects in heterojunction devices have a greater role in transport mechanism than in recombination mechanism. The results show that in devices with a large number of defects at the interface, the fill factor degrades with little change in open circuit voltage. This explains why it is relatively easy to obtain VOC´s approaching 700 mV with heterojunctions but often with low fill factors.
Keywords
elemental semiconductors; solar cells; surface recombination; Si; amorphous silicon; crystalline silicon surface; defect state density; heterointerface; heterojunction solar cell; intrinsic layer; recombination mechanism; transport mechanism; voltage 700 mV; Computational modeling; Doping; Electric fields; Heterojunctions; Performance evaluation; Photovoltaic cells; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location
Honolulu, HI
ISSN
0160-8371
Print_ISBN
978-1-4244-5890-5
Type
conf
DOI
10.1109/PVSC.2010.5614387
Filename
5614387
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