DocumentCode :
2736425
Title :
Fast and precise resistance characterisation of laser drilled and metallized vias
Author :
Menkoe, Michael ; Reitenbach, Hermann ; Hoenig, Rene ; Clement, Florian ; Biro, Daniel ; Preu, Ralf
Author_Institution :
Fraunhofer Inst. for Solar Energy Syst. (ISE), Freiburg, Germany
fYear :
2010
fDate :
20-25 June 2010
Abstract :
Concerning cell concepts using metallized vias for the interconnection between the front- and the rear side in general, for example the MWT (Metal Wrap Through) concept, via resistance losses have a high impact on cell performance. Hence, establishing a fast, precise and reliable characterization instrument allowing a faster development of metallization pastes and hole drilling processes is the purpose of this work.
Keywords :
laser beam applications; metallisation; solar cells; contact unit; hole drilling process; laser drilled vias; laser metallized vias; measurement unit; metallization pastes; precise measurement; precise resistance; solar cell; through-hole contact; viatester; Current measurement; Electrical resistance measurement; Geometry; Measurement by laser beam; Metallization; Probes; Resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location :
Honolulu, HI
ISSN :
0160-8371
Print_ISBN :
978-1-4244-5890-5
Type :
conf
DOI :
10.1109/PVSC.2010.5614396
Filename :
5614396
Link To Document :
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