DocumentCode :
2736635
Title :
Growth and characterization of thick epitaxial GaAs layers
Author :
Samic, H. ; Bourgoin, J.C. ; Pajot, B. ; Bisaro, R. ; Grattepain, C. ; Khirouni, K. ; Putero, M. ; Burle, N.
Author_Institution :
Saobracajini Fakultet, Sarajevo, Bosnia-Herzegovina
fYear :
1997
fDate :
8-11 Sep 1997
Firstpage :
155
Lastpage :
158
Abstract :
We present an economical and non polluting vapor phase technique, allowing the growth of practically all III-V and II-VI compounds, using water as reactant. This technique will be illustrated here in the case of GaAs. We show that GaAs can be grown at very high growth rates. This has been used to obtain thick layers. We demonstrate that these layers exhibit good structural, electrical and optical properties when grown, at least, up to 5 μm per minute. Since doping can be mastered, millimeter thick layers can be grown in a reasonable time, opening new applications for epitaxial GaAs layers such as high power electronics, nuclear detection and optics
Keywords :
III-V semiconductors; gallium arsenide; semiconductor epitaxial layers; semiconductor growth; vapour phase epitaxial growth; CVD epitaxial growth; GaAs; VPE growth; millimeter thick layers; thick epitaxial layers; vapor phase technique; Epitaxial layers; Gallium arsenide; Optical detectors; Optical materials; Optical sensors; Power electronics; Substrates; Temperature; Water pollution; Water resources;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Compound Semiconductors, 1997 IEEE International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7503-0556-8
Type :
conf
DOI :
10.1109/ISCS.1998.711603
Filename :
711603
Link To Document :
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