• DocumentCode
    2736635
  • Title

    Growth and characterization of thick epitaxial GaAs layers

  • Author

    Samic, H. ; Bourgoin, J.C. ; Pajot, B. ; Bisaro, R. ; Grattepain, C. ; Khirouni, K. ; Putero, M. ; Burle, N.

  • Author_Institution
    Saobracajini Fakultet, Sarajevo, Bosnia-Herzegovina
  • fYear
    1997
  • fDate
    8-11 Sep 1997
  • Firstpage
    155
  • Lastpage
    158
  • Abstract
    We present an economical and non polluting vapor phase technique, allowing the growth of practically all III-V and II-VI compounds, using water as reactant. This technique will be illustrated here in the case of GaAs. We show that GaAs can be grown at very high growth rates. This has been used to obtain thick layers. We demonstrate that these layers exhibit good structural, electrical and optical properties when grown, at least, up to 5 μm per minute. Since doping can be mastered, millimeter thick layers can be grown in a reasonable time, opening new applications for epitaxial GaAs layers such as high power electronics, nuclear detection and optics
  • Keywords
    III-V semiconductors; gallium arsenide; semiconductor epitaxial layers; semiconductor growth; vapour phase epitaxial growth; CVD epitaxial growth; GaAs; VPE growth; millimeter thick layers; thick epitaxial layers; vapor phase technique; Epitaxial layers; Gallium arsenide; Optical detectors; Optical materials; Optical sensors; Power electronics; Substrates; Temperature; Water pollution; Water resources;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compound Semiconductors, 1997 IEEE International Symposium on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7503-0556-8
  • Type

    conf

  • DOI
    10.1109/ISCS.1998.711603
  • Filename
    711603