DocumentCode :
2736697
Title :
THz Emitters and Detectors Based on Ion Implanted III-V Semiconductors
Author :
Lloyd-Hughes, J. ; Fu, L. ; Castro-Camus, E. ; Merchant, S. ; Tan, H.H. ; Jagadish, C. ; Johnston, M.B.
Author_Institution :
Oxford Univ., Oxford
fYear :
2006
fDate :
18-22 Sept. 2006
Firstpage :
149
Lastpage :
149
Abstract :
Ultrafast charge carrier dynamics in semiconducting materials ultimately determine the performance of photoconductive terahertz (THz) emitters and receivers. Ion implantation of III-V semiconductors allows carrier dynamics to be tailored for a particular application, and thus the technique is increasingly being applied to the development of advanced materials for terahertz photonics. In this talk I will briefly introduce the technique of ion implantation and review some recent applications in THz photonics. 1 will then present time resolved conductivity studies of GaAs:As+, InGaAs:Fe+, InP:O+ and InP:Fe+ and relate these results to improved terahertz emitter and detector performance.
Keywords :
III-V semiconductors; arsenic; gallium arsenide; indium compounds; ion implantation; iron; submillimetre wave detectors; GaAs:As; III-V semiconductors; InGaAs:Fe; InP:Fe; InP:O; THz detectors; THz emitters; THz photonics; charge carrier dynamics; ion implantation; photoconductive emitters; receivers; terahertz photonics; time resolved conductivity; Charge carriers; Conducting materials; Detectors; III-V semiconductor materials; Ion implantation; Optical receivers; Photoconducting devices; Photoconducting materials; Photonics; Semiconductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0400-2
Electronic_ISBN :
1-4244-0400-2
Type :
conf
DOI :
10.1109/ICIMW.2006.368357
Filename :
4222091
Link To Document :
بازگشت