DocumentCode :
2736830
Title :
A Goodness-of-Fit Test for GEE Models with Binary Longitudinal Data Based on Smoothing Methods
Author :
Lin, Kuo-Chin ; Chen, Yi-Ju
Author_Institution :
Tainan Univ. of Technol., Tainan
fYear :
2007
fDate :
5-7 Sept. 2007
Firstpage :
245
Lastpage :
245
Abstract :
The logistic regression models have received widespread use for analyzing binary response data. In longitudinal studies, correlated data arise and such data are often analyzed by generalized estimating equations (GEE) method. This article proposes an alternative goodness-of-fit test based on nonparametric smoothing approach for assessing the adequacy of GEE fitted models, which can be regarded as an extension of the goodness-of-fit test of le Cessie and van Houwelingen (1991). The approximate expectation and variance of the proposed test statistic are derived. The power performance of test is discussed by simulation study and the testing procedure is illustrated by a clinical trial example.
Keywords :
data analysis; regression analysis; smoothing methods; GEE method; binary response data; generalized estimating equations method; goodness-of-fit test; logistic regression models; nonparametric smoothing approach; Covariance matrix; Data analysis; Equations; Logistics; Medical tests; Parameter estimation; Smoothing methods; Statistical analysis; Technology management; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Innovative Computing, Information and Control, 2007. ICICIC '07. Second International Conference on
Conference_Location :
Kumamoto
Print_ISBN :
0-7695-2882-1
Type :
conf
DOI :
10.1109/ICICIC.2007.28
Filename :
4427890
Link To Document :
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