Piezoelectric devices for frequency control and selection in Japan

Author

Fujishima, Satoru

Author_Institution

Murata Manuf. Co. Ltd., Kyoto, Japan

fYear

1990

fDate

4-7 Dec 1990

Firstpage

87

Abstract

Typical results of the distribution of SAW velocity in a substrate as measured by the line-focus-beam ultrasonic microscope are reported. The designs of oscillator circuits using bulk wave and surface acoustic wave resonators are analyzed. Maximum input power for SAW devices is limited by electrode migration, which depends on the maximum stress at interdigital-transducer electrodes. Stress distribution in a SAW substrate can be calculated and shown graphically by the finite element method. The use of oriented Al electrodes, instead of ordinary amorphous Al electrodes, can increase the life of quartz-crystal SAW resonators over 1000 times. Finally, the reliability of dipped resin packages for TV VIF SAW filters is reported

Keywords

crystal resonators; frequency control; radiofrequency oscillators; surface acoustic wave devices; surface acoustic wave filters; SAW devices; SAW substrate; SAW velocity distribution; TV VIF SAW filters; dipped resin packages; electrode migration; finite element method; frequency control; interdigital-transducer electrodes; line-focus-beam ultrasonic microscope; oscillator circuits; quartz-crystal SAW resonators; reliability; surface acoustic wave resonators; Acoustic measurements; Electrodes; Frequency control; Microscopy; Piezoelectric devices; Stress; Surface acoustic wave devices; Surface acoustic waves; Ultrasonic variables measurement; Velocity measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Ultrasonics Symposium, 1990. Proceedings., IEEE 1990

Conference_Location

Honolulu, HI

Type

conf

DOI

10.1109/ULTSYM.1990.171331

Filename

171331