• DocumentCode
    2736898
  • Title

    The potential efficiency of laser doped solar cells using photoluminescence imaging

  • Author

    Lee, Eunjoo ; Lee, Hyunwoo ; Kim, Llhwan ; Choi, Junyoung ; Oh, Dongjun ; Shim, Jimyung ; Cho, Kyungyeun ; Kim, Jisun ; Lee, Hae-Seok ; Lee, Soohong ; Hallam, B. ; Wenham, S.R.

  • Author_Institution
    R&D Center, Shinsung Holdings, Seongnam, South Korea
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    In this work we evaluate the implied open circuit voltages (iVoc) at various stages of production of laser doped selective emitter (LDSE) solar cells using photoluminescence (PL) imaging The change of the iVoc values after the laser doping (LD) has shown that this process has minimal effect on cell performance. It is also found that the order of processes such as edge junction isolation and silicon nitride is of critical importance prior to light induced plating. If these processes are not performed in the correct order, localised shunts may form during the light induced plating (LIP) process which then inhibits plating near the edge of the cells. In this work, an impressive efficiency of 18.3% has been achieved, even though the fill factor was only 74.2% and the cell suffered from additional shading losses due to overplating. With the optimization of the LD and metallization processes cells have the potential to reach efficiencies of more than 19.2% on full size commercial substrates.
  • Keywords
    electroplating; elemental semiconductors; laser materials processing; photoluminescence; semiconductor device manufacture; semiconductor device metallisation; semiconductor doping; solar cells; crystalline silicon solar cell industry; edge junction isolation; implied open circuit voltages; laser doped selective emitter solar cells; light induced plating process; metallization processes; photoluminescence imaging; silicon nitride;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5614424
  • Filename
    5614424