• DocumentCode
    2737189
  • Title

    Mismatch Modeling and Simulation Methodology for Predicting the Output Voltage Variation of an LCD Driver

  • Author

    Hoshino, Kozo ; Shimomura, Narakazu

  • Author_Institution
    Integrated Circuit Group, Sharp Corp., Tenri
  • fYear
    2005
  • fDate
    Nov. 2005
  • Firstpage
    317
  • Lastpage
    320
  • Abstract
    This paper presents a new mismatch modeling and simulation methodology for predicting the output voltage variation of an LCD (liquid crystal display) driver. The new model is especially effective for MV (medium voltage) MOSFETs which have a drift resistance region in the source/drain areas on both sides of the gate electrode. The new model takes into account the effect of drift resistance on the mismatch properties of the threshold voltage and the current gain. As a result, the model shows high precision over a wide range of transistor sizes and bias conditions. Circuit level SPICE simulation results show a better prediction for the output voltage variation than previous approaches
  • Keywords
    MOSFET circuits; SPICE; circuit simulation; driver circuits; liquid crystal displays; LCD driver; SPICE simulation; liquid crystal display; medium voltage MOSFET; mismatch modeling; mismatch simulation; output voltage prediction; Circuit simulation; Driver circuits; Electrodes; Integrated circuit modeling; Liquid crystal displays; MOSFETs; Medium voltage; Predictive models; SPICE; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Solid-State Circuits Conference, 2005
  • Conference_Location
    Hsinchu
  • Print_ISBN
    0-7803-9163-2
  • Electronic_ISBN
    0-7803-9163-2
  • Type

    conf

  • DOI
    10.1109/ASSCC.2005.251729
  • Filename
    4017595