DocumentCode
2737257
Title
Design of a properly scaled 100 nm pseudomorphic HEMT using H2F
Author
Asenov, A. ; Babiker, S. ; Cameron, N. ; Beaumont, S.P. ; Barker, J.R.
Author_Institution
Dept. of Electron. & Electr. Eng., Glasgow Univ., UK
fYear
1995
fDate
34792
Firstpage
42552
Lastpage
42557
Abstract
In this paper we report on a systematic approach to the design of 100 nm gate length PHEMT using full scale 2D simulation with the recently developed Heterojunction 2D Finite element semiconductor device simulator H2F. The design approach involves four stages: fabrication of pilot devices; validation of the simulator against measured characteristics of these devices; redesign and optimisation of the vertical layer structure based on extensive simulation of 100 nm gate length devices, and finally fabrication of the optimised 100 nm PHEMTs and iterative improvements
Keywords
finite element analysis; high electron mobility transistors; semiconductor device models; 100 nm; H2F; design; device scaling; heterojunction 2D finite element semiconductor device simulator; iteration; optimisation; pseudomorphic HEMT;
fLanguage
English
Publisher
iet
Conference_Titel
Physical Modelling of Semiconductor Devices, IEE Colloquium on
Conference_Location
London
Type
conf
DOI
10.1049/ic:19950432
Filename
478370
Link To Document