• DocumentCode
    2737451
  • Title

    Utilization of Dynamic Reducts to Improve Performance of the Rule-Based Similarity Model for Highly-Dimensional Data

  • Author

    Janusz, Andrzej

  • Author_Institution
    Fac. of Math., Inf., & Mech., Univ. of Warsaw, Warszaw, Poland
  • Volume
    3
  • fYear
    2010
  • fDate
    Aug. 31 2010-Sept. 3 2010
  • Firstpage
    432
  • Lastpage
    435
  • Abstract
    This paper presents an extension to the Rule-Based Similarity (RBS) model a novel rough set approach to the problem of learning a similarity relation from data. The original model, proposed in [1], applied the notion of Tversky´s feature contrast model in a rough set framework to facilitate an accurate case-based classification. In the dynamic RBS model, a dynamic reducts technique is used to broaden the scope of the considered similarity aspects. This is especially important when dealing with objects described by numerous attributes. The extended model was tested on several microarray datasets from RSCTC´2010 Discovery Challenge. The results proved that it is significantly more accurate than the original RBS as well as some other popular classification algorithms, such as the random forest or k-NN combined with several attribute selection methods.
  • Keywords
    knowledge based systems; learning (artificial intelligence); pattern classification; rough set theory; Tversky feature contrast model; attribute selection methods; case-based classification; dynamic reducts technique; k-nearest neighbor classification; random forest classification; rough set approach; rule-based similarity model; similarity relation learning; Bioinformatics; Context; Data models; Heuristic algorithms; Humans; Information systems; Training; Rule-Based Similarity; classification; similarity learning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Web Intelligence and Intelligent Agent Technology (WI-IAT), 2010 IEEE/WIC/ACM International Conference on
  • Conference_Location
    Toronto, ON
  • Print_ISBN
    978-1-4244-8482-9
  • Electronic_ISBN
    978-0-7695-4191-4
  • Type

    conf

  • DOI
    10.1109/WI-IAT.2010.118
  • Filename
    5614461