DocumentCode
2737464
Title
Microgrid efficiency enhancement based on neuro-fuzzy MPPT control for Photovoltaic generator
Author
Chaouachi, Aymen ; Kamel, Rashad M. ; Nagasaka, Ken
Author_Institution
Tokyo Univ. of Agric. & Technol., Koganei, Japan
fYear
2010
fDate
20-25 June 2010
Abstract
In terms of optimal Microgrid (MG) control, the output power of a non-dispatchable Distributed Generation (DG) as a Photovoltaic (PV) system need to be controlled based on the optimal operating condition of its primary energy source by the mean of a Maximum Power Point Tracking (MPPT) to extract the potential maximum power which is nonlinearly depending on the weather conditions. In this work we presented a new methodology for this purpose using an approach based on a neuro-fuzzy generalized method to estimate the reference voltage (V*pv) that guaranties an optimal power transfer between the DG and the microgrid. The neuro-fuzzy network is composed of a fuzzy rule-based classifier and three Radial Basis Functions Neural Networks (RBFNN). Inputs of the network (irradiance and temperature) are classified before they are fed into the appropriated network for either training or estimation process. Simulation results under several rapid irradiance variations proved that the proposed MPPT control for the PV generator achieved high energy conversion efficiency comparing to a Normal Operating Power (NOP) (when the PV generator is directly coupled to the inverter, without MPPT control).
Keywords
fuzzy neural nets; maximum power point trackers; photovoltaic power systems; power control; high energy conversion efficiency; maximum power point tracking; microgrid control; microgrid efficiency enhancement; neuro-fuzzy MPPT control; photovoltaic generator; photovoltaic system; radial basis functions neural networks; Generators; Inverters; Mathematical model; Photovoltaic systems; Reactive power; Voltage control; MPPT; Microgrid; Neuro-Fuzzy; Photovoltaic; RBFNN;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location
Honolulu, HI
ISSN
0160-8371
Print_ISBN
978-1-4244-5890-5
Type
conf
DOI
10.1109/PVSC.2010.5614462
Filename
5614462
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