• DocumentCode
    2737687
  • Title

    Carbon Nanotube Based Infrared Detector Array

  • Author

    Zhang, Jiangbo ; Xi, Ning ; Chen, Hongzhi ; Lai, King W C ; Luo, Yilun

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI
  • fYear
    2008
  • fDate
    18-21 Aug. 2008
  • Firstpage
    100
  • Lastpage
    103
  • Abstract
    As a promising nanomaterial, carbon nanotube (CNT) has been studied for infrared sensing with their unique properties such as wide range of band gaps and reduced carrier scattering. However, due to the traditional inefficient and unreliable fabrication processes, the research of CNT based infrared sensors remained on the single pixel study, which significantly limited the further investigation and application of CNTs in infrared sensing. In this study, a reliable and efficient nanomanufacturing process was used to build CNT based infrared detector array. A pixel is fabricated by assembling a single CNT or a small bundle of CNTs onto a pair of microelectrodes to form connections. The assembly process utilizes the dielectrophoresis deposition method to attract CNTs around the microelectrodes and the Atomic Force Microscope (AFM) nanomanipulation system to position CNTs. Since the process is reliable and controllable, it enables the possibility to fabricate CNT based infrared detector arrays. A three-pixel CNT based infrared detector array with a 10 mum pixel pitch was fabricated in this paper. The electronic and photonic properties of each pixel are tested and characterized. Experimental results have shown that the three pixels have small thermal crosstalk between adjacent pixels, which is an important factor limiting the pixel pitch of infrared focal plane arrays (IRFPAs). Since the traditional IRFPAs have a pixel pitch in the range of 25-50 mum or even larger, their resolutions are normally very low. The small pixel pitch of the developed CNT detector array makes it possible to fabricate high resolution IRFPAs.
  • Keywords
    atomic force microscopy; carbon nanotubes; electrophoresis; energy gap; focal planes; infrared detectors; microelectrodes; nanoelectronics; nanotube devices; AFM; C; CNT based infrared sensors; IRFPA; atomic force microscope nanomanipulation system; band gaps; carbon nanotube based infrared detector array; carrier scattering; dielectrophoresis deposition method; electronic properties; infrared focal plane arrays; microelectrodes; nanomanufacturing process; photonic properties; pixel pitch; size 10 mum; size 25 mum to 50 mum; thermal crosstalk; Atomic force microscopy; Carbon nanotubes; Electromagnetic scattering; Fabrication; Infrared detectors; Infrared sensors; Microelectrodes; Particle scattering; Photonic band gap; Sensor arrays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
  • Conference_Location
    Arlington, Texas
  • Print_ISBN
    978-1-4244-2103-9
  • Electronic_ISBN
    978-1-4244-2104-6
  • Type

    conf

  • DOI
    10.1109/NANO.2008.37
  • Filename
    4617019