DocumentCode
2737873
Title
Optically Defined Chemical Functionalization of Silicon Nanomechanical Resonators for Mass Sensing
Author
Baldwin, Jeffrey W. ; Zalalutdinov, Maxim K. ; Pate, Bradford B. ; Martin, Michael J. ; Houston, Brian H.
Author_Institution
Naval Res. Lab., Washington, DC
fYear
2008
fDate
18-21 Aug. 2008
Firstpage
139
Lastpage
142
Abstract
Nanomechanical resonators with their extremely small mass and high surface/volume ratio present a unique opportunity for mass sensing [1-4]. However, functionalization with selective vapor adsorptive functional groups has been an impediment to the realization of nanomechanical systems for mass sensing. Functional groups that adsorb analytes of interest should be patterned only on the nanoresonator itself, and should not be located on structural elements or micro-channel walls, which would greatly limit the minimum detectible limit of the overall device. Also, traditional spin cast polymer films present the problem of being many times thicker than the nanomechanical resonator, essentially burying the resonator in the adsorptive polymer and completely damping the resonator. To address this, we are using a generic monolayer functionalization scheme based on a UV-mediated reaction between terminal alkenes and a hydrogen terminated silicon surface [5]. Specifically, we report the selective surface functionalization with a vapor adsorptive monolayer of hexafluoro-dimethylcarbinol on polycrystalline silicon nanomechanical resonators.
Keywords
adsorption; crystal resonators; mass measurement; micromechanical resonators; nanotechnology; sensors; silicon; surface treatment; UV-mediated reaction; adsorb analytes; hexafluoro-dimethylcarbinol; hydrogen terminated silicon surface; mass sensing; microchannel walls; optically defined chemical functionalization; selective surface functionalization; selective vapor adsorptive functional groups; silicon nanomechanical resonators; terminal alkenes; Chemicals; Nanoscale devices; Optical films; Optical resonators; Optical sensors; Pattern analysis; Polymer films; Silicon; Surface impedance; Ultraviolet sources;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location
Arlington, TX
Print_ISBN
978-1-4244-2103-9
Electronic_ISBN
978-1-4244-2104-6
Type
conf
DOI
10.1109/NANO.2008.48
Filename
4617030
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