DocumentCode
2737880
Title
Integrating the design and reliability assessment of a hybrid Pv-Thermal microconcentrator system
Author
Vivar, M. ; Van Scheppingen, R. ; Clarke, M. ; Everett, V. ; Walter, D. ; Harvey, J. ; Surve, S. ; Muric-Nesic, J. ; Blakers, A.
Author_Institution
Centre for Sustainable Energy Syst., Australian Nat. Univ., Canberra, ACT, Australia
fYear
2010
fDate
20-25 June 2010
Abstract
The Australian National University (ANU) is developing a new hybrid CPV-Thermal micro-concentrator (MCT) system working at a concentration ratio of 20 to 30X. System design and reliability testing have been integrated as concurrent processes, enabling the early optimisation of the concentrator system design. The key feature of this integrated design-test procedure is that carefully selected sets of simple tests can be conducted concurrently with the design of the concentrator module, without introducing time delays in the module design phase. Test results provide valuable information that significantly informs the design process and helps to avoid future failures. The ANU hybrid micro-concentrator receiver also provides heat for domestic applications, introducing special requirements for tests of the active cooling system. IEC 62108 tests procedures have been analysed in order to verify and extend their suitability for active cooling systems. A modified and extended test sequence is proposed to assess actively-cooled CPV and CPV-T systems.
Keywords
cooling; delays; optimisation; reliability; solar cells; solar energy concentrators; ANU hybrid microconcentrator receiver; Australian National University; IEC 62108 tests procedures; active cooling system; concentrator module; concentrator system design; concurrent process; domestic applications; hybrid CPV-thermal microconcentrator system; optimisation; reliability assessment; time delays; Cooling; IEC standards; Materials; Receivers; Reliability; Thermal conductivity; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location
Honolulu, HI
ISSN
0160-8371
Print_ISBN
978-1-4244-5890-5
Type
conf
DOI
10.1109/PVSC.2010.5614486
Filename
5614486
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