DocumentCode
2737931
Title
Employing a computer integrated manufacturing methodology for improved product quality and reduced machine downtime
Author
Harris, Brian R. ; Firsty, Wayne S. ; Eppinger, Steven D. ; Kirtley, James L., Jr. ; Clausing, Don P. ; Jenkins, Robert A.
Author_Institution
MIT, Cambridge, MA, USA
fYear
1990
fDate
21-23 May 1990
Firstpage
290
Lastpage
295
Abstract
A methodology for using CIM for process improvement is presented. The technique places particular emphasis on reducing machine downtime and improving product quality. The authors present a tool that allows management to allocate resources to CIM projects most effectively in order to achieve maximum results with limited resources. Two applications of the CIM technology are presented. The major results of reduced machine downtime and reduced process waste are discussed. The methodology presented is based on a top-down strategic vision and a bottom-up tactical implementation. It is structured along three dimensions: collection of data from the production line, improvement of the production process using that data, and distribution of that data to benefit all affected parties. It helps to give the CIM team direction as it addresses the complexities of transforming the corporate CIM vision into a production-floor reality
Keywords
manufacturing computer control; manufacturing data processing; resource allocation; CIM; bottom-up tactical implementation; data collection; machine downtime; product quality; resource allocation; top-down strategic vision; waste reduction; Computer integrated manufacturing; Computerized monitoring; Consumer products; Costs; Design engineering; Knowledge engineering; Manufacturing processes; Process control; Production equipment; Resource management;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Integrated Manufacturing, 1990., Proceedings of Rensselaer's Second International Conference on
Conference_Location
Troy, NY
Print_ISBN
0-8186-1966-X
Type
conf
DOI
10.1109/CIM.1990.128113
Filename
128113
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