DocumentCode
2738097
Title
Engineering the Band Gap of Carbon Nanotubes
Author
Luo, Yilun ; Zhang, Jiangbo ; Xi, Ning ; Chen, Hongzhi ; Lai, King WaiChiu ; Fung, Carmen KarMan ; Tarn, T.J.
Author_Institution
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI
fYear
2008
fDate
18-21 Aug. 2008
Firstpage
183
Lastpage
186
Abstract
For traditional semiconducting materials, band gap is a unique characteristic which limits the material´s applications and device´s performance. The capability of on-chip adjusting semiconducting material´s band gap is extremely important in manufacturing electronic devices. As a one-dimensional nano material with excellent electrical properties, carbon nanotube (CNT) has a band gap determined by the circumferential quantum confinement, which depends on the tube diameter. Hence for a multi-walled carbon nanotube (MWCNT), the band gap can be on-chip adjusted by electrically removing its outer carbon shells. This paper discusses a real-time control method for controlling the MWCNT band gap adjusting process. A state space model was developed based on the quantum model for electron transport inside a nanotube. The rapid change of the system state, which represents the occurrence of electrical breakdown, can be observed using robust fault detection technique for breakdown process control. Experimental results show that the breakdown control system can effectively convert metallic MWCNTs to semiconducting MWCNTs and further adjust the band gap, which is especially important for optical detection to reduce the dark current and enhance the photo current.
Keywords
carbon nanotubes; dark conductivity; electric breakdown; elemental semiconductors; energy gap; photoconductivity; semiconductor nanotubes; 1D nanomaterial; C; MWCNT; band gap; dark current; electrical breakdown; electrical properties; electron transport; electronic device manufacturing; multiwalled carbon nanotubes; photocurrent; quantum confinement; quantum model; semiconducting materials; space model; Carbon nanotubes; Electric breakdown; Electrons; Organic materials; Photonic band gap; Potential well; Semiconductivity; Semiconductor device manufacture; Semiconductor materials; State-space methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location
Arlington, TX
Print_ISBN
978-1-4244-2103-9
Electronic_ISBN
978-1-4244-2104-6
Type
conf
DOI
10.1109/NANO.2008.60
Filename
4617042
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