Title :
A New Method for Microwave Characterization of Metallic Single-Walled Carbon Nanotubes
Author :
Song, Chunrong ; Liu, Zuqin ; Eres, Gyula ; Geohegan, David B. ; Wang, Pingshan
Author_Institution :
Dept. of Electr. & Comput. Eng., Clemson Univ., Clemson, SC
Abstract :
On-chip subtraction of capacitive parasitic effects is proposed for microwave characterization of individual metallic single-walled carbon nanotube (mSWNT) that yields low intensity signals. The method dramatically reduces capacitive parasitic effects to uncover the otherwise buried signals. Both computer simulations and experimental measurements of small capacitance demonstrated the efficacy of the approach.
Keywords :
carbon nanotubes; electrical conductivity; microwave spectra; nanotechnology; C; capacitive parasitic effects; metallic single-walled carbon nanotubes; microwave characterization; on-chip subtraction; small capacitance; Capacitance measurement; Carbon nanotubes; Circuit testing; Materials science and technology; Microwave theory and techniques; Parasitic capacitance; Power dividers; Power transmission lines; Scattering parameters; Transmission line measurements;
Conference_Titel :
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
978-1-4244-2103-9
Electronic_ISBN :
978-1-4244-2104-6
DOI :
10.1109/NANO.2008.74
