DocumentCode :
2738432
Title :
IEEE P1149.4-almost a standard
Author :
Cron, Adam
Author_Institution :
Motorola Inc., Schaumburg, IL, USA
fYear :
1997
fDate :
1-6 Nov 1997
Firstpage :
174
Lastpage :
182
Abstract :
The IEEE P1149.4 Mixed-Signal Test Bus Working Group is on the cusp of delivering a document that will finally standardize the architecture for, and the method of access to, the analog portion of mixed-signal circuits for test and diagnostic applications. This Standard will have the same profound effect on the design and test community that IEEE 1149.1 had previously. P1149.4 gives the test infrastructure the capability to measure discrete impedances external to devices supporting the Standard using a 6-wire bus. This bus uses 4 of the same signals used today to support 1149.1 compliant devices and subsystems. This paper will detail the basic architecture; give some design-specific information and data learned through the Standard´s development process; relate results from several test devices; and provide a basic example of usage
Keywords :
IEEE standards; automatic test equipment; computer architecture; integrated circuit testing; mixed analogue-digital integrated circuits; standardisation; system buses; 6-wire bus; IEEE P1149.4 standard; Mixed-Signal Test Bus; design; diagnostic applications; mixed-signal circuits; standardisation; test and diagnostic applications; test infrastructure; Business; Circuit testing; Digital circuits; Impedance measurement; Integrated circuit interconnections; Integrated circuit testing; Measurement standards; Pins; System testing; USA Councils;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-4209-7
Type :
conf
DOI :
10.1109/TEST.1997.639611
Filename :
639611
Link To Document :
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